IRCT SCANNER SYSTEMS
DB254 Double IRCT Scanner System (IR Test 50V to 2kV)

DB254 Double IRCT Scanner System IR Test 50V to 2kV. System has been designed to combine the  high measurement quality of Insulation Resistance, Capacitance and Tan d in either quality control departments or when testing smaller sized production runs.
It has been designed to fully satisfy the high demands of capacitor manufacturers’ quality departments or official approval bodies of electrical equipment.
Among the major benefits by choosing one of the DB254 Scanner Systems are faster, easier and more safe operation than the traditional methods.


DB254 Double IRCT Scanner System

  • Fully automatic turnkey systems

  • Fast and automatic test parameters as 
    Voltage test, IR test, capacitance and 
    dissipation factor tests.

  • All capacitance measurements are 
    performed with 4-terminal fixtures with 
    active guard for excellent results 
    even at 100kHz.

  • All features controlled by Windows 
    operated software

  • Measurement reports are generated 
    automatically for printout or in a spreadsheet 
    format for easy and detailed examination.

  • Easily managed and intuitive user interface

For price and info please email sales@hotektech.com or call 253-927-6186 ext. 1

Related Instruments LCR Meters
Bridges Wheatstone, Kelvin
Component Testers
Ohmmeters
Insulation Testers
Digital Multimeters

HARDWARE

A scanner system can be tailor made to fit the requirements of the individual customer from the different Danbridge products.

The scanner unit is a central part of a scanner system. 
This will be DB254.

Furthermore, the Scanner System DB254 will contain the following items:
- One CLR tester, DB232.
- One Megohmmeter, DB604.
- One 40 channel Insulation Resistance scanner, DB640
- One standard PC equipped by latest version of Control Software.
- One printer

All system parts will be integrated at Danbridge, and set operational at the customers site by authorized Danbridge personnel.

Specifications  DB254 DB254 Double IRCT Scanner System
Measured parameters High voltage, Insulation Resistance, Leakage Current, Capacitance Dissipation Factor,

Measuring Frequencies 

100/120 Hz, 1 kHz, 10 kHz and  100 kHz

Measuring Time

 Complete test for 40 capacitors in less than 5 minutes.
Maximum testing
Voltages		  For capacitors with lead distance
 -    ³ 7.5 mm: Max 2000Volts.
   -   ³ 5 mm: Max 1000 Volts.

Fixtures 

 40 sets of 4-terminal Kelvin contacts, for axial and radial components. Optional SMD Fixtures available.

Interfaces

 IEEE 448 (GPIB).
Environment  Ambient temperature: 10 - 40 degrees Celsius.
Power 90 - 130V AC/120 - 250V AC/
50 - 60Hz.

 
Accuracy for DC Current Measurements
Accuracy  ±2% of value ±2pA
   C

100/120 kHz

1 k Hz

10k Hz

100 kHz
 30 - 100pF

-

  ±0.5%  ±0.1  ±0.1%
 100 - 400pF  ±0.1%  ±0.1%  ±0.1%  ±0.1%
 400pF - 159nF  ±0.1%  ±0.05%  ±0.05%  ±0.05%
 159nF - 1µF  ±0.1%  ±0.05%  ±0.05%  ±0.05%
 1µF - 10µF*  ±0.5%  ±0.1%  ±0.1%  ±0.1%
 10µF - 300µF  ±0.5%*C/Cmin  ±0.5%*C/Cmin  ±0.1%*C/Cmin   -
Note: No Specification better than ±0.1pF
Accuracy for Dissipation Factor

Tan ¶

100/120 kHz

1 kHz

10 kHz

100 kHz
 30 - 100pF   -  ±0.0005%  ±0.0005%  ±0.0010%
 100 - 400pF   ±0.0010%  ±0.0002%  ±0.0002%  ±000.5%
 400pF - 159 nF  ±0.0007%  ±0.0002%  ±0.0002%  ±0.0003%
 159nF - 1µF  ±0.0005%  ±0.0002%  ±0.00002%  ±0.0005%
 1Fµ - 10µF*  ±0.0007%  ±0.0007%  ±0.000.7%  ±0.0007%
 10µF - 300µF  ±0.0007*C/Cmin  ±0.0007*C/Cmin  ±0.0007*C/Cmin  ±0.0007*C/Cmin
*Average Count higher than 4

 ALL SPECIFICATIONS SUBJECT TO CHANGES WITHOUT PRIOR NOTICE

Please email sales@hotektech.com or call 253-927-6186 if you are interested in a purchase, or
  need additional information.

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